Key features

• •U
• •s
• •e
• •d
• •B
• •Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure
• •Offers a detailed explanation of algorithms and mathematics behind measurements and error correction
• •Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader
• •Written by the principle developer and designer of many of the measurement methods described